How to obtain color images with the STM, with the color variations representing varying electronic structures of the sample surface.

General description of electron beam sources and the resulting reaction of the incident electron beams on the surface for various energies of the electrons.

Low-energy electron diffraction (LEED) database of diffracted intensities versus incident electron energy I(V) spectra for various elements.

Elements of thin films nucleation and growth.

Basics of reflection-high energy electron diffraction (RHEED).

Scanning tunneling microscopy (STM) images of metal surfaces, obtained by the surface physics group at the Institut für Allgemeine Physik (IAP), TU Wien, Austria.

The Surface Analysis Forum is for scientists from academia and industry with a common interest in Electron Spectroscopy for Chemical Analysis and surface science in general. The site also contains an introduction on experimental techniques and links to online databases.

The XPS database gives easy access to the energies of many photoelectron and Auger-electron spectral lines. The database contains over 22,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines.